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 Wafer Surface Inspection : CD Measurement
Search Result
 
      showing 1 - 5 of 5  
 
Nanometrics Nanoline CD 50 Measure Nanometrics
Nanometrics Nanoline CD 50
Nanometrics Nanoline CD 50 Measure Refurb
$27,000.00 Contact Sales View more detail specification and photos
 
Nanometrics Nanoline CRD III Measure Nanometrics
Nanoline CRD III Measure
Nanometrics Nanoline CRD III Measure Refurb
$9,100.00 Contact Sales View more detail specification and photos
 
Nanometrics Nanoline IV CD Measure Nanometrics
Nanoline IV
Nanometrics Nanoline IV CD Measure Refurb
Contact Sales View more detail specification and photos
 
Nanometrics Nanoline V CD Measure Nanometrics
Nanoline V
Nanometrics Nanoline V CD Measure Refurb
Contact Sales View more detail specification and photos
 
OPAL 7830i CD-SEM OPAL
OPAL 7830i
OPAL 7830i CD-SEM Used
Contact Sales View more detail specification and photos
      showing 1 - 5 of 5  



Due to equipment location and/or prior sale, some pictures are used for "reference only."
 
Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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