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 Wafer Surface Inspection : General Inspection
Search Result
 
      showing 1 - 8 of 8  
 
ADE Ultra Gage 9500 Metrology Tool ADE
9500 Ultra Gage
ADE Ultra Gage 9500 Metrology Tool Used
Contact Sales View more detail specification and photos
 
Dektak 3030ST Profilometers Veeco (Sloan/Dektak)
Dektak 3030ST Profiler
Dektak 3030ST Profilometers Used
Contact Sales View more detail specification and photos
 
FSM 128 FSM
FSM 128 Flatness system
FSM 128 Used
Contact Sales View more detail specification and photos
 
QC Optics OPTIQUEST reticle inspection QC Optics
QC Optics OPTIQUEST
QC Optics OPTIQUEST reticle inspection Used
Contact Sales View more detail specification and photos
 
Semiconductor Diagnostics Inc. Model SPV CMS 4010 Semiconductor Diagnostics Inc.
SPV CMS 4010
Semiconductor Diagnostics Inc. Model SPV CMS 4010 Used
$.00 Contact Sales View more detail specification and photos
 
Tencor Flexus 2908 Tencor
Tencor Flexus 2908
Tencor Flexus 2908 Used
Contact Sales View more detail specification and photos
 
Veeco FPP 100 4-Point Probes Veeco (Sloan/Dektak)
Veeco FPP 100
Veeco FPP 100 4-Point Probes Used
$5,500.00 Contact Sales View more detail specification and photos
 
Viking VIS-100W Die Inspection Systems Viking
VIS-100W Die Inspection System
Viking VIS-100W Die Inspection Systems Used
$7,500.00 Contact Sales View more detail specification and photos
      showing 1 - 8 of 8  



Due to equipment location and/or prior sale, some pictures are used for "reference only."
 
Sitek Process Solutions, Inc. Phone: 916.797.9000 Fax: 916.797.9009
233 Technology Way, Building A-3, Rocklin, CA 95765.
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