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Description:
Tencor Surfscan 4000
(Surfscan 4000 Particle Counter)
Tencor 4000 Wafer Particle Counter. Used to measure particles on bare silicon wafers. Particle sensitivity: 0.3um. Haze sensitivity: 1 PPM. Spatial resolution: 100 um particle spacing. Substrate sizes 2" to 6". Measurement time for a 6" substrate: 30 seconds.
System will be fully refubished. Looks and runs great.
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