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Description:
ADE 6033 Thickness Gauges
(6033T)
MicroSense 6033T The Model 6033T, using ADE’s patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (TVV). Whenever semiconductor wafer inspection is required, the MicroSense Model 6033T offers a low cost method of achieving fast, accurate measurements on wafers up to 150mm in diameter. Features · Non-contact · Low cost · All-electronic gaging · Fast set-up · Easy operation · Thickness, TTV
See "More details" below for a detailed specification sheet.
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