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Description:
Rudolph Auto EL IV Ellipsometer
(Rudolph EL IV Ellipsometer)
Rudolph Auto EL-IV Ellipsometer
* Multi-Wavelength Automatic Ellipsometer. * User can select between 3 wavelengths-405 nm, 546 nm , 633 nm. * Display film thickness, index order thickness or substrate N and K. * Capable of calculating the parameters for single or double absorbing films and non-absorbing films. * 115V, 60 Hz.
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